Posted on 19/05/2016
A patent describing the measuring method and protocol developed by Envira Sostenible for the continuous monitoring of environmental parameters. Spain 201030980.
The aim of this invention is a continuous environmental monitoring system based on nanotechnology techniques, elements and procedures, and also based on measuring the different resistivity of a metallic oxide obtained from nanotechnological processes as opposed to different compounds in the environment. The measuring process is very quick and can be sensitive to concentration variations in a short period of time.
Explanation of the invention:
The first aspect of this invention is a continuous monitoring system for environmental parameters that includes several remote devices for collecting data with a central processing unit (CPU); and a central server to manage data collection, storage and communication. Its remote devices for data collection include a central processing unit and the means for collecting data. This processing unit is connected to several analogue inputs, several analogue outputs and at least a communication module, GPS location devices and local display devices for the data measured. Data is collected by at least one ambient or indoor air quality sensor, based on the measurement of the different resistivity posed by a metallic oxide obtained from nanotechnological processes as opposed to different compounds in the environment. The remote server includes means of remote communication; it sends SMS messages both to request information and to set up the remote devices and the management of analogical signals and digital values, so it can send alert messages to different users registered in the server.
A second aspect of the invention is the method for the continuous monitoring of environmental parameters, and it includes the following phases: